作者:标准资料网 时间:2024-05-15 02:01:26   浏览:9758   来源:标准资料网

【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part29:Latch-uptest
【原文标准名称】:半导体器件.机械和气候试验方法.闭锁试验
【标准号】:BSEN60749-29-2003
【标准状态】:作废
【国别】:英国
【发布日期】:2004-03-09
【实施或试行日期】:2004-03-09
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:多语种的;半导体器件;气候试验;试验;半导体;耐力;电子设备及元件;闭锁;电气工程;术语;压电器件;过电压试验;尺寸;环境试验;机械试验;频率稳定;集成电路;电子工程;元部件;谐振器;介电性能;压电的;介质;定义;电学测量
【英文主题词】:Climatictests;Components;Definition;Definitions;Dielectric;Dielectricproperties;Dimensions;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Frequencystabilization;Integratedcircuits;Latch-up;Mechanicaltesting;Multilingual;Overvoltagetests;Piezoelectric;Piezoelectricdevices;Resistance;Resonators;Semiconductordevices;Semiconductors;Terminology;Testing;Testingdevices
【摘要】:ThispartofIEC60749coversthel-testandtheovervoltagelatch-uptestingofintegratedcircuits.Thistestisclassifiedasdestructive.Thepurposeofthistestistoestablishamethodfordeterminingintegratedcircuit(IC)latch-upcharacteristicsandtodefinelatch-upfailurecriteria.Latch-upcharacteristicsareusedindeterminingproductreliabilityandminimizing"NoTroubleFound"(NTF)and"ElectricalOverstress"(EOS)failuresduetolatch-up.ThistestmethodisprimarilyapplicabletoCMOSdevices.Applicabilitytoothertechnologiesmustbeestablished.InthispartofIEC60749latch-upisnotrelatedtoaspecificmechanismbutisanelectricalfailurecharacteristicthatoccurswhenadeviceissubjectedtothistestmethod.Theclassificationoflatch-upasafunctionoftemperatureisdefinedin2.1andthefailurelevelcriteriaaredefinedin2.10
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:24P.;A4
【正文语种】:英语